Monday 7th April 2025 starting at 18:00 CET

18:00 Pre-conference networking drinks reception

Tuesday 8th April 2025 starting at 08:00 CET

08:00 Registration and welcome refreshments 08:50 Housekeeping by Chris Meadows and Tim Bettles - Conference Chairs Expanding the emission envelope 09:00 Expanding the Spectral Range of GaN-based SLEDs Presented by Marco Malinverni - Exalos 09:15 Perfecting GaN VCSEL Production Process Presented by Tetsuya Takeuchi - Meijo University 09:30 Connected Metrology for Growth and Characterization of InP and GaAs Laser Structures – from Epi to Etch Presented by Iris Claussen - LayTec AG 09:45 Germanium as an Enabler for Large Volume Production in PV and Photonics Presented by Ivan Zyulkov - Umicore 10:00 InP NIR VCSELs from 1.3 µm to beyond 2 µm for Single Mode and Multi Mode Applications Presented by Christian Neumeyr - Vertilas 10:15 Ultraviolet to Infrared in a Single Spectrum Presented by Yves Lacroix - YSystems Ltd 10:30 The Power of Pseudomorphic Nitrides Presented by Leo Schowalter - Lit Thinking 10:45 Morning Break GaN: Going beyond fast charging 11:25 Achieving Avalanche in GaN-on-silicon Diodes Presented by Farid Medjdoub - University of Lille 11:40 Characterizing GaN: Challenges and Advances in Next-Generation Semiconductor Metrology Presented by Áron Pekker - Semilab 11:55 X-ray Metrology Solutions for Compound Semiconductors from Labs to Fabs. Presented by Assunta Vigliante - Rigaku 12:10 AIXTRON Leading Epitaxy Solutions for High Volume Manufacturing of GaN-based Power Devices Presented by Dr. Nicolas Muesgens - Aixtron 12:25 Improving GaN Defect Analysis and Characterization with Novel Electron Microscopy Workflow Presented by Antonio Mani - Thermo Fisher Scientific 12:40 GaN’s Takeover: The Next Big Leap in Power Electronics Presented by Ezgi Dogmus - Yole Group 12:55 Lunch Break 14:25 Harnessing the Underestimated Potential of GaN in the Digitalization Revolution: A Catalyst for Unforeseen Innovation in Energy Efficiency Presented by Roberto Crisafulli - STMicroelectronics 14:40 Epitaxial GaN Growth using MBE for the Development of Next-Generation Devices Presented by Romain Bruder - Riber 14:55 VECTOR: Advancing SEM Metrology with Automation and Versatility Presented by Amanda Wscieklica - Raith 15:10 Driving Adoption of GaN for Power Electronics via 300mm Technology Presented by Rudy Parekh - Veeco 15:25 Advancement in X-Ray Metrology for High Volume Manufacturing of GaN Based Power Devices Presented by Qian Zheng - Bruker 15:40 Afternoon Break Maintaining momentum for the microLED 16:20 Perfecting the Polychromatic Pixel Presented by Michelle Chen - Q-Pixel Inc 16:35 MicroSolid Printing: Redefining the Future of MicroLED Displays Presented by Reza Chaji - VueReal 16:50 Leveraging NIL for µLED Lens Packaging Presented by Thomas Achleitner - EV Group 17:05 The Future of MicroLED Displays: Which Applications Are Leading in 2025? Presented by Raphaël Mermet-Lyaudoz - Yole Group 17:20 Pioneering Mass Production and Commercialisation of MicroLED Microdisplays for AR Presented by Kunal Kashyap - Porotech 17:35 Revolutionising microLED Displays with Nanowires Presented by Pierre Tchoulfian - Aledia 17:50 Closing Remarks 18:00 Networking Drinks / Dinner Reception

Wednesday 9th April 2025 starting at 08:00 CET

08:00 Registration and welcome refreshments 08:50 Housekeeping by Chris Meadows and Tim Bettles - Conference Chairs Optimising opportunities for SiC success 09:00 20 Years of SiC Innovation Leadership: Trench-Assisted Planar Gate Technology Presented by Llewellyn Vaughan-Edmunds - Navitas 09:15 Solving Challenges in Compound Semiconductors: An Equipment Supplier’s Perspective Presented by David Britz - Applied Materials 09:30 Building the World’s Most Cost-efficient SiC Fab Presented by Peter Friedrichs - Infineon 09:45 Integrated Metal Etch and Photoresist Strip Solution for SiC Manufacturing Presented by Bernhard Hammerl - Siconnex Customized Solutions GmbH 10:00 High Sensitivity & Throughput Defect Inspection Technologies for SiC and GaN Power Technologies Presented by Mike Rosa - Onto Innovation 10:15 SCREEN’s Sustainable Cost-of-Ownership (CoO) Portfolio for Wafer Inspection and Thickness Measurement Tools and HVM experience Presented by Alessandro Rossi - SCREEN SPE 10:30 Morning Break 11:10 Artificial Intelligence for SiC Yield Optimization Presented by Marius Fischer - Nanotronics 11:25 PVA TePla Metrology Solutions for Compound Semiconductors Presented by Ivan Orlov - PVA TePla AG, and Markus Stöhr - PVA TePla AG 11:40 How Artificial Intelligence Heralds the New Era of Wafering Presented by Malte Mueller - Lapmaster Wolters 11:55 Crystal Orientation for Optimizing Quality and Yield throughout the Process Chain Presented by Andrey Zameshin - Malvern Panalytical 12:10 How to save process cost in your SiC/GaN production using best in class power supplies? Presented by Yannick Schneider - TRUMPF 12:25 Lunch Break Ultra-wide bandgap materials: The ultimate devices Sponsored by Precision Fabricators 13:55 Prospects of (ultra) Wide Bandgap Oxide ICs Presented by Xiaohang Li - KAUST 14:10 A Solution to Doping AlN Enabling a New Era of Nitride Semiconductors Presented by Alan Doolittle - Georgia Institute of Technology 14:25 Electric Field Engineering to Unlock the Potential of Gallium Oxide Power Devices Presented by Nolan Hendricks - AFRL (Air Force Research Laboratory) 14:40 Efficient Diameter Enlargement of Bulk AlN Presented by Carsten Hartmann - Leibniz-Institut für Kristallzüchtung (IKZ) 14:55 The promise of cubic Boron Nitride (c-BN) Presented by Siddha Pimputkar - Lehigh University 15:10 Closing Remarks