VCSELs pervade our everyday lives, from face recognition in smartphones to communication networks, and the ramp in demand is showing no signs of slowing. Pressure for manufacturers to ship more chips, combined with tighter specification tolerance of emerging applications has resulted in an ever-increasing need for rapid device-level feedback within a production cycle. To meet this need, we developed a 24hr quick-fab VCSEL process within the Institute for Compound Semiconductors and on-wafer testing to deliver assessment of wafer-uniformity and performance validation. Here we present examples of quick-fab for VCSELs grown on GaAs and Ge substates up to 200mm in diameter.
Dr Samuel Shutts received his PhD degree in Physics in 2013 and is now a Senior Lecturer specialising in compound semiconductor optoelectronics at Cardiff University. He plays an active role supporting the Institute for Compound Semiconductors, acting as Scientific Advisor in Photonics and Optoelectronics. Research interests include Vertical Cavity Surface Emitting Lasers, DFB and DBR edge-emitting lasers, quantum dot lasers, monolithic integration of III-Vs on silicon, and atomic quantum sensors for clocks, gyroscopes, and magnetometers.