Silicon photonics is key to enabling the revolution in high-performance computing. Advancing from copper to optics in data center racks comes with specific challenges and drives photonic integrated circuit (PIC) technology maturation more strongly than ever. How efficient and fast the path to finding the optimal PIC design depends on the capabilities of the test equipment. Do you find PIC design validation challenging? Would you like to accelerate the development cycle rate and be first to market? Join this discussion to learn how to reduce on-wafer test time and manage optical losses and polarization. The scope of this session includes DC optical, RF electro-optical, and on-wafer functional tests.
Daria Lavrova joined Keysight in July, 2022 as a Product planner and she is responsible for strategical planning on the next-generation photonics T&M solutions. Prior to joining Keysight Daria had a versatile experience working as a researcher at ITMO University, Russia with a focus on fiber-optic sensing systems and LiNbO3-based modulators and in parallel leading a start-up that commercialized a novel technology of Fiber Bragg Grating sensors interrogation. Daria got her PhD degree in optical measurements science in 2019. Current topics of interest are photonics T&M solutions, PICs and optical communication systems.