Sometimes reinventing the wheel can be the right path to advance technology. As industrialization of optical materials shifted from communication application centered NIR wavelengths to the blue spectrum of nitrides in the late nineties to then extend to deep ultraviolet emitter and sensor materials, we see it now trending back to the infrared and beyond for both communication and machine vision applications. The basic metrology concepts from 30 years ago still apply however automation, device optical sensitivity, lasers and other components that make up characterization equipment has tremendously evolved since then. We look at some of the things we can do now that we could not do then.
Dr Yves Lacroix is a physicist-inventor turned entrepreneur currently managing three technology related companies in Japan. The first venture, now YSystems Ltd. was started in 2001 while he was doing research on blue laser diodes and ultra-violet LEDs at the University of Tokushima. One of the first researchers to succeed in making a GaN based structure lase at the time, he still believes good metrology is the key to progress in any development. He obtained his Ph.D. in physics from Simon Fraser University in Canada where he designed and built the (probably still) only existing fully cryogenically cooled Michelson Interferometer