PRESENTATION

PVA TePla Metrology Solutions for Compound Semiconductors

The abstract for this presentation is not yet available.

Frédéric Falise

PVA TePla AG

Frédéric Falise has over 30 years of experience in corporate roles within the high-tech industry. He holds an MD in engineering along with business diplomas from Kellogg and IMD business schools. His expertise lies in the strategic development of crystal inspection technologies, business planning, and go-to-market strategies. He is COO of Scientific Visual (Switzerland) – the industry leader in automated crystal inspection solutions, working in strategic partnership with PVA TePla since 2024.

Michael Schöler

PVA TePla AG

Dr. Michael Schöler holds a PhD in Materials Science from Friedrich-Alexander University of Erlangen-Nuremberg, Germany. With more than 10 years of experience in SiC crystal growth and the semiconductor industry, he has held several positions in Product Management, Project Management and Sales. As Business Development Manager at PVA TePla, Michael is shaping the future semiconductor business of PVA TePla and is the contact person for customers and cooperation partners.