AI-backed process control augments AOI capabilities by providing facility-wide in situ anomaly detection, KPI prediction, and autonomous control of equipment, all while continuously monitoring for security breaches. This signals a paradigm shift in inspection system architecture, as the data stored by a single inspection tool can now be leveraged to train AI models that produce “Virtual Inspection” measurements at scale, at low cost, with zero throughput impact, for every process layer. As manufacturing volume grows, the ability to inspect each stratum of production becomes essential, and existing AOI systems generate the most valuable insights when linked with a panoptic machine learning agent that provides complete overview of facility performance.
Sanjay is the Director of Product at Nanotronics and has degrees in Biological Sciences and Forensic Molecular Biology from Binghamton University and SUNY Albany. At Nanotronics, Sanjay works closely with customers to understand their unique applications and needs to identify and fill product gaps to expand the capabilities of our products and improve customer experience. Prior to working at Nanotronics, Sanjay was a criminalist at the New York City Office of Chief Medical Examiner’s Department of Forensic Biology.