PRESENTATION

RAITH VECTOR in Compound Semiconductors

The transfer of innovation from Lab-to-Fab requires Fab-compatible processes and protocols in Labs. VECTOR instrument combines key capabilities such as process characterization, lithography process control, defect review, and inspection in one automated SEM. Through various examples, this presentation highlights the capabilities of this new tool and its contribution to the transfer of cutting-edge nanotechnologies into new industrial devices.

Jean-Claude Menard

Raith

From mid-1990s, he has held various positions in the areas of after-sales service, R&D, applications and sales in the fields of Scanning Electron Microscopy and micro-nano analytical tools, Concept introducer and patent holder, Jean-Claude, is listening to users, meeting the future challenges of the industrial world.