Quantifying What Matters: In-Line TXRF for Surface-Metal Control and Yield Optimization in SiC Fabs. An Integrated Study Using in-line TXRF to Predict and Prevent Yield Excursions

Meredith Beebe

Rigaku

Accomplished analytical chemist and application scientist with 15+ years of experience in X-ray metrology in the semiconductor industry. Highly skilled in trace metal laboratory analysis. Strong project management, customer support, and problem-solving skills. Cultivates and maintains trusted business relationships. Ability to write and adapt technical presentations to various levels of audiences. Author of numerous published articles and presentations.