Advancements in X-ray Metrology for GaN and Compound Semiconductors

Assunta Vigliante

Rigaku

Assunta Vigliante is an X-ray technology professional with over 30 years of experience in industry, academia, and national laboratories. She holds a PhD in Physics from the University of Houston, Texas, USA, and has held academic positions in the USA and Europe. Assunta later transitioned to industry, where she took on senior roles in several semiconductor companies. She is currently the Director of Technology for the Semiconductor Division at Rigaku. In addition, Assunta has served as an expert advisor for the European Commission and other professional organizations in the US and Europe.