PRESENTATION

Use cases of optical and electrical metrologies for compound semiconductor market

We would like to present specific solutions from SEMILAB's wide variety of metrology portfolio for compound material characterization. The presentation focuses on non-contact and non-destructive methods' applications in process monitoring. Through relevant use cases, our goal is to highlight the importance of metrology systems at compound semiconductor related production facilities.

Attila Márton

Semilab

Attila is Head of Resistivity & Mobility Charachterisation Department in Semilab, and as a product manager is responsible for the development of non-contact mobility & sheet resistance measurement systems and Mercury CV profiling systems.