ICs in today’s automobiles are subjected to stringent quality as chip reliability is critical to both vehicle safety, performance and function. The automobile industry requires a zero-defect strategy, with a target to achieve ≤1 defect/million. KLA’s portfolio of solutions enable process development and effective process control to meet this zero-defect strategy. With solutions covering semiconductor wafer quality, processing, defect inspection and metrology needs, you will be able to inspect and find critical defects, measure critical process attributes and fine tune your production processes to achieve yield targets that meet automobile reliability and safety requirements.
Bernhard Botters manages sales for the KLA Instruments™ group in Europe. With 3+ years of experience at KLA, his main area of focus are defect inspection and surface metrology of compound semiconductor wafers, including SiC and GaN. He started his career as an application engineer at Filmetrics and worked since then at different positions in the field of optical surface metrology. Bernhard received his Dipl.-Phys. at the University in Hamburg in 1998 with a focus on semiconductor physics.