PRESENTATION

Advanced Metrology Strategies for High-Yield SiC Manufacturing in Mature and Emerging Power Markets

Shrinking margins in SiC manufacturing demand unprecedented control over material quality and process stability. This presentation examines how advanced analytical and metrology techniques enable early defect detection, process consistency and yield improvement across SiC substrates and epitaxial layers. Attendees will gain insight into how precision measurement drives improved reliability and competitive advantage in SiC device production.

Tamzin Lafford

Bruker UK

Tamzin is Senior Applications Scientist in the semiconductor X-ray group at Bruker UK. She has spent her career in X-ray characterisation of materials since completing her PhD in the mid 1990s. She has worked with a wide range of customers worldwide, in both academia and industry, looking to match characterisation and metrology solutions to customer issues and demonstrate those capabilities adapted to customer needs. Tamzin holds a PhD in solid state physics and a BSc (Hons) in Applied Physics from the University of Bath, UK.