Tamzin is Senior Applications Scientist in the semiconductor X-ray group at Bruker UK. She has spent her career in X-ray characterisation of materials since completing her PhD in the mid 1990s. She has worked with a wide range of customers worldwide, in both academia and industry, looking to match characterisation and metrology solutions to customer issues and demonstrate those capabilities adapted to customer needs. Tamzin holds a PhD in solid state physics and a BSc (Hons) in Applied Physics from the University of Bath, UK.
To ensure that fleets of metrology tools, across multiple sites and countries, used by different operators, are capable of ensuring products can ship reliably, Bruker ensures its tools are calibrated and qualified under an ISO9001-2015 quality management system using certified NIST standard samples. This allows customers to be confident that their measurement tools are well calibrated, giving stable and reliable results. This talk will address the importance of the traceability of Bruker metrology tools to NIST standards and the importance of a statistically sound approach.