Maarten Raimond
Business Development Manager
Tektronix
Maarten is Business Development Manager for Keithley specializing in electrical parametric test, he has spent almost 40 years in wafer test technology, first with an automatic wafer prober company and since 2011 with Keithley Instruments/Tektronix, responsible for EMEA and SEA for parametric test. During the years, worked with customers in all parts of the world to optimize their production wafer test, and their research and quality tests.
Presentations
Electrical Parametric Characterization of Wide-Bandgap Semiconductor Wafers and Devices
This speech explores electrical parametric characterization techniques for wide bandgap semiconductor wafers and devices, focusing on SiC and GaN technologies. It addresses Tektronix Keithley solutions to measure key parameters such as IV, CV, leakage, breakdown, mobility, and defect-related signatures, and explains how these metrics link material quality to device performance and reliability. Emphasis is placed on wafer-level testing, probing control, and data analysis to enable early process control and yield learning. Practical case studies illustrate challenges unique to wide bandgap materials, highlighting best practices for accurate, repeatable, and scalable characterization in manufacturing and R&D environments, worldwide adoption.