Qian Zheng is an Application Scientist and Product Marketing Manager in the Bruker semiconductor X-ray business unit. She is responsible for demo measurements, applications support, marketing materials and customer support across a range of X-ray metrology products. Qian Zheng has a PhD in materials Physics from the Autonomous University of Madrid. With over 15 years’ experience in semiconductor materials, she has been engaged in research and development of crystal growth, device fabrication and materials characterisation.
Gallium Nitride (GaN) power devices have seen increasing adoption in various industries due to their ability to operate at higher efficiencies, frequencies, and temperatures compared to traditional silicon-based devices. The ramp-up in GaN based power devices is driven by key factors such as their expanding use in consumer electronics, electric vehicles (EVs), data centers, and industrial applications. Traditionally, X-ray metrology involved manual equipment configuration, analysis, and reporting, which could be time-consuming and prone to human error. Over the years, Bruker has automated these processes, significantly improving throughput and accuracy. Automated X-ray metrology systems now provide real-time, in-line measurements that are integrated directly into the manufacturing process, allowing for immediate feedback and corrective actions when necessary. This enables manufacturers to accelerate R&D, production line ramp-up, and maximize yield, thus shortening time to market and improving profitability.